{"id":5583,"date":"2020-10-06T14:23:19","date_gmt":"2020-10-06T14:23:19","guid":{"rendered":"http:\/\/mead.ch\/mead\/?p=5583"},"modified":"2026-04-09T09:12:52","modified_gmt":"2026-04-09T09:12:52","slug":"techniques-for-handling-noise-and-variability-in-analog-circuits-2","status":"publish","type":"post","link":"https:\/\/mead.ch\/mead\/techniques-for-handling-noise-and-variability-in-analog-circuits-2\/","title":{"rendered":"Techniques for Handling Noise and Variability in Analog Circuits"},"content":{"rendered":"

<\/a><\/p>\n

Abstracts<\/a>Practical Information<\/a>Course Material<\/a><\/div>\n

On-Line Class
\nCET – Central European Time Zone
\n<\/span><\/h3>\n

Download One-Page Schedule Here<\/a><\/p>\n\n\n\n
\n

Week 1: January 18-22, 2027<\/h4>\n

Week 2: January 25-29, 2027<\/h4>\n

Registration deadline: January 4, 2027<\/strong><\/span>
\nPayment deadline: January 8, 2027<\/strong><\/span><\/td>\n

\"registration\"<\/a><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n\n\n\n\n\n\n
\n

TEACHING HOURS
\n<\/strong><\/span><\/h4>\n<\/td>\n<\/tr>\n

DAILY<\/td>\nCentral European Time CET<\/strong>
\n(Lausanne)<\/td>\n		Eastern Standard Time EST
\n<\/strong>(New York)<\/td>\n		Pacific Standard Time PST<\/strong>
\n(California)<\/td>\n		India Standard Time IST<\/strong> (India)<\/td>\n<\/tr>\n
Module 1<\/td>\n3:00-4:30 pm<\/td>\n9:00-10:30 am<\/td>\n6:00-7:30 am<\/td>\n7:30-9:00 pm<\/td>\n<\/tr>\n
Module 2<\/td>\n5:00-6:30 pm<\/td>\n11:00-12:30 am<\/td>\n8:00-9:30 am<\/td>\n9:30-11:00 pm<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

WEEK 1: January 18-22<\/strong><\/span><\/h3>\n\n\n\n\n\n\n\n\n\n\n\n\n\n
\n

Monday, January 18<\/strong><\/span><\/h4>\n<\/td>\n<\/tr>\n

3:00-6:30 pm<\/td>\nRandom Mismatch Origins<\/td>\nMarcel Pelgrom<\/td>\n<\/tr>\n
\n

Tuesday,\u00a0<\/strong><\/span>January 19<\/strong><\/span><\/h4>\n<\/td>\n<\/tr>\n

3:00-6:30 pm<\/td>\nAnalyzing Mismatch and Yield in Analog Circuits<\/td>\nMarcel Pelgrom<\/td>\n<\/tr>\n
\n

Wednesday, January 20<\/strong><\/span><\/h4>\n<\/td>\n<\/tr>\n

3:00-6:30 pm<\/td>\nLayout Strategies to Reduce Offset<\/td>\nMarcel Pelgrom<\/td>\n<\/tr>\n
\n

Thursday, January 21<\/strong><\/span><\/h4>\n<\/td>\n<\/tr>\n

3:00-6:30 pm<\/td>\nFundamentals of Noise in Electronic Devices<\/td>\nChristian Enz<\/td>\n<\/tr>\n
\n

Friday, January 22<\/strong><\/span><\/h4>\n<\/td>\n<\/tr>\n

3:00-4:30 pm<\/td>\nOffset and CMRR: Systematic and Random<\/td>\nMichiel Steyaert<\/td>\n<\/tr>\n
5:00-6:30 pm<\/td>\nVoltage and Current References<\/td>\nMichiel Steyaert<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

WEEK 2: January 25-29<\/strong><\/span><\/h3>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
\n

Monday, January 25<\/strong><\/span><\/h4>\n<\/td>\n<\/tr>\n

3:00-4:30 pm<\/td>\nNoise Cancellation Techniques<\/td>\nFilip Tavernier<\/td>\n<\/tr>\n
5:00-6:30 pm<\/td>\nNoise Sampling in Switched Capacitor Filters<\/td>\nFilip Tavernier<\/td>\n<\/tr>\n
\n

Tuesday, January 26<\/strong><\/span><\/h4>\n<\/td>\n<\/tr>\n

3:00-6:30 pm<\/td>\nNoise Analysis in Continuous-Time and\u00a0Sampled-Data Circuits<\/td>\nChristian Enz<\/td>\n<\/tr>\n
\n

Wednesday, January 27<\/strong><\/span><\/h4>\n<\/td>\n<\/tr>\n

3:00-4:30 pm<\/td>\nNoise and Offset Reduction Techniques<\/td>\nChristian Enz<\/td>\n<\/tr>\n
5:00-6:30 pm<\/td>\nDynamic Offset-Cancellation Techniques<\/td>\nKofi Makinwa<\/td>\n<\/tr>\n
\n

Thursday, January 28<\/strong><\/span><\/h4>\n<\/td>\n<\/tr>\n

3:00-4:30 pm<\/td>\nDynamic Offset-Cancellation Techniques<\/td>\nKofi Makinwa<\/td>\n<\/tr>\n
5:00-6:30 pm<\/td>\nDynamic Element-Matching Techniques<\/td>\nKofi Makinwa<\/td>\n<\/tr>\n
\n

Friday, January 29<\/strong><\/span><\/h4>\n<\/td>\n<\/tr>\n

3:00-4:30 pm<\/td>\nDynamic Element-Matching Techniques<\/td>\nKofi Makinwa<\/td>\n<\/tr>\n
5:00-6:30 pm<\/td>\nCase Studies in Precision Analog Circuit Design<\/td>\nKofi Makinwa<\/td>\n<\/tr>\n
\"registration\"<\/a><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

Scroll to Top<\/a><\/p>\n

\n

<\/a><\/p>\n

Abstracts<\/strong><\/span><\/h2>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
\n

Techniques for Handling Noise and Variability in Analog Circuits
\nOn-Line Class
\nJanuary 18-29, 2027<\/b><\/p>\n<\/td>\n<\/tr>\n

\n

Random Mismatch Origins
\nMarcel Pelgrom, Pelgrom Consult, The Netherlands
\n<\/b><\/p>\n

Circuit design greatly depends on the ability to control and reproduce process and device parameters. Statistical variations between otherwise identical components are generally described by \u201cmismatch\u201d parameters.\u00a0 This lecture will analyze the origins of mismatch, such as random dopant fluctuations. Understanding and mitigating these effects requires statistical means.
\nThe general mismatch model will be discussed and compared to measurements. The application to the current variation in MOS transistors is analyzed. The relation to technological parameters, Finfet, SOI and design choices is explained.<\/p>\n<\/td>\n<\/tr>\n

\n

Analyzing Mismatch and Yield in Analog Circuits
\nMarcel Pelgrom, Pelgrom Consult, The Netherlands
\n<\/b><\/p>\n

Analog ICs with differential operation are heavily affected by mismatch. In today\u2019s advanced technologies every circuit from SRAM cell to an I-Q mixer must deal with statistical variations. \u00a0This lecture deals with handling the statistical effects in circuits, analyzing input referred random offsets and estimating yield. Examples start with the analysis of a simple differential pair, and are extended to opamps, voltage and current steering DACs, bandgaps and other analog circuits. The theory is also applied to timing chains, ring oscillators and yield analysis of flash converters. \u00a0Options to reduce the effect of mismatch and gradients are discussed.<\/p>\n<\/td>\n<\/tr>\n

\n

Layout Strategies to Reduce Offset
\nMarcel Pelgrom, Pelgrom Consult, The Netherlands
\n<\/b><\/p>\n

After an introduction on elementary IC device characteristics and circuit analysis aspects (statistics, spread, fluctuations, parametric gradients), this lecture focuses on the main attention areas of mixed-signal circuit layout, namely electrical design related issues and technology related hazards. The design part discusses topics like IR drop, power supply loops, mirroring of lay-outs, \u00a0temperature gradients and design discipline. The technology part focuses on proximity and reticle effects, advanced lithography such as double patterning, layout induced mechanical stress asymmetries, and common centroid layout solutions. \u00a0The lecture finishes with a comprehensive set of guidelines.<\/p>\n<\/td>\n<\/tr>\n

\n

Fundamentals of Noise in Electronic Devices
\nChristian Enz, EPFL, Switzerland
\n<\/b><\/p>\n

After variability, noise represents the ultimate limitations of analog circuits. Designers therefore need to be able to optimize circuits for low-noise operation. This lecture starts with the presentation of the mathematical tools needed for analyzing and optimizing noise in circuits. The definition of power spectral density and its use for the calculation of noise bandwidth and noise power are given. The different types of noise, their origin and properties are described, including thermal, shot and flicker noise. The noise models of different devices are then described with a special attention to the MOS transistor. The noise at RF is also described including the concept of noise matching with the noise factor and the other noise parameters. The lecture is illustrated with many examples.<\/p>\n<\/td>\n<\/tr>\n

\n

Offset and CMRR: Systematic and Random
\nMichiel Steyaert, KU Leuven, Belgium
\n<\/b><\/p>\n

Mismatch between transistors, resistors and capacitors causes severe limitations in the performance of differential circuitry. They are expressed by parameters such as offset, CMRR and PSRR. These sources of random and systematic mismatch are discussed in detail. The parameters are analyzed for differential pairs, current mirrors, operational transconductance amplifiers, etc. A number of design guidelines are put together for better matching.<\/p>\n<\/td>\n<\/tr>\n

\n

Voltage and Current References
\nMichiel Steyaert, KU Leuven, Belgium
\n<\/b><\/p>\n

Precision applications require a bandgap reference, with an accurate temperature coefficient over a wide range of temperatures. It usually consists of a bipolar transistor in which a resistor develops a PTAT (proportional-to-absolute-temperature) voltage. It can also be realized with a MOST in weak inversion with appropriate temperature compensation. Mismatch between the transistor parameters leads to a high level of variability, which can only be reduced by trimming. Examples are given for both bipolar and CMOS technologies.<\/p>\n<\/td>\n<\/tr>\n

\n

Noise Cancellation Techniques
\nFilip Tavernier, KU Leuven, Belgium
\n<\/b><\/p>\n

Wireless receivers all start with an LNA (Low-noise amplifier) to provide gain with very low noise and distortion. Impedance and noise matching is normally used at the input. The recent ones all provide wide-band performance, and use both noise and distortion cancellation. They yield higher FOM\u2019s than hitherto possible. The Focus is on noise cancellation techniques, some of which are applicable to any amplifier or filter.<\/p>\n<\/td>\n<\/tr>\n

\n

Noise Sampling in Switched Capacitor Filters
\nFilip Tavernier, KU Leuven, Belgium
\n<\/b><\/p>\n

Switched-capacitor filters are preferred at low frequencies because they only require switches, capacitors and operational amplifiers. The matching between the capacitors determines the accuracy of the filter frequencies. Techniques are discussed to reduce the power consumption without increasing the noise levels. Numerical examples are given of several SC filter designs followed by examples of Sigma-Delta modulators using SC filters for noise shaping.<\/p>\n<\/td>\n<\/tr>\n

\n

Noise Analysis in Continuous-Time and Sampled-Data Circuits
\nChristian Enz, EPFL, Switzerland
\n<\/b><\/p>\n

Noise problems have always two aspects: the description and modeling of the physical noise sources in devices and the way this noise is propagating in the circuit to the output. Whereas the above lecture is dedicated to the noise sources, this part is focused on the understanding and modeling of the noise in circuits. It starts with the calculation of noise in continuous-time circuits. The analysis allows to identify which are the fundamental device and circuit noise parameters and how they can be optimized for low-noise. The effect of noise sampling and aliasing occurring in sampled-data circuits such as switched-capacitor (SC) circuits is then described. A simple technique for calculating noise power in SC circuits is then presented. Finally, the basic principles for reducing low frequency noise are presented: autozero and correlated-double sampling in sampled-data circuits and chopper stabilization in continuous-time circuits.<\/p>\n<\/td>\n<\/tr>\n

\n

Dynamic Offset-Cancellation Techniques
\nKofi Makinwa, TU Delft, The Netherlands
\n<\/b><\/p>\n

In amplifiers, component mismatch can easily cause offsets of several (tens of) millivolts. This can be reduced to the microvolt level by the application of dynamic techniques such as auto-zeroing and chopping. Compared to the alternatives, i.e. the use of large devices or trimming, the use of dynamic techniques has the added advantage of also reducing 1\/f noise and drift, making it possible to design amplifiers that are thermal-noise limited. In this lecture, an introduction to auto-zeroing and chopping will be given, their pros and cons highlighted and recent advances in the state-of-the-art reviewed.<\/p>\n<\/td>\n<\/tr>\n

\n

Dynamic Element Matching Techniques
\nKofi Makinwa, TU Delft, The Netherlands
\n<\/b><\/p>\n

Component mismatch also limits the gain accuracy of amplifiers and the linearity of data converters. In such systems, the use of dynamic element matching (DEM) allows a trade-off to be made between speed and precision. The use of DEM allows gain accuracies of a few ppm to be realized even in standard CMOS processes, as well as data-converters whose SNDR can exceed 100dB. In this lecture, an introduction to DEM will be presented, and its application to precision amplifiers and highly linear data converters will be discussed.<\/p>\n<\/td>\n<\/tr>\n

\n

Case Studies in Precision Analog Circuit Design
\nKofi Makinwa, TU Delft, The Netherlands
\n<\/b><\/p>\n

Various combinations of dynamic error correction techniques can be employed to realize precision amplifiers with superior noise, offset, linearity and gain accuracy. For instance, chopping and auto-zeroing can be combined to reduce switching artefacts, while chopping can be combined with DEM to achieve both low-offset and high gain accuracy. In this lecture, the use of such techniques to realize state-of-the-art precision amplifiers will be illustrated with the help of a number of case studies.<\/p>\n<\/td>\n<\/tr>\n

\"registration\"<\/a><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

Scroll to Top<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"

AbstractsPractical InformationCourse Material On-Line Class CET – Central European Time Zone Download One-Page Schedule Here Week 1: January 18-22, 2027 Week 2: January 25-29, 2027 Registration deadline: January 4, 2027 Payment deadline: January 8, 2027 TEACHING HOURS DAILY Central European Time CET (Lausanne) Eastern Standard Time EST (New York) Pacific Standard Time PST (California) India<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"jetpack_post_was_ever_published":false,"_jetpack_newsletter_access":"","_jetpack_dont_email_post_to_subs":false,"_jetpack_newsletter_tier_id":0,"_jetpack_memberships_contains_paywalled_content":false,"_jetpack_memberships_contains_paid_content":false,"footnotes":""},"categories":[31],"tags":[],"class_list":["post-5583","post","type-post","status-publish","format-standard","hentry","category-on-line-class"],"yoast_head":"\nTechniques for Handling Noise and Variability in Analog Circuits - 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